Gary Wayne Loew
Gary Wayne Loew is the former Editor in Chief of The American Philatelist.
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Exploring the APEX Reference Collection: Biafra
Exploring the APS Reference Collection
Adventures in Expertizing: Analytical Expertizing
APS Experts certify rare, historic first day cover and related stamps
APS Experts Certify Omitted Die Cut Error Panes on Bush Stamp
Canada Post Pays Tribute to French-Canadian Authors
Scott English, Executive Director
Susanna Mills, Editor in Chief
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