Gary Wayne Loew
Gary Wayne Loew is the Editor in Chief of The American Philatelist.
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Expertizing the 1¢ Franklins: When Experts Disagree
A Behind-the-Scenes Look at How We Expertize, Featuring a 1-cent Franklin
Exploring the APEX Reference Collection: Biafra
Exploring the APS Reference Collection
Adventures in Expertizing: Analytical Expertizing
APS Experts certify rare, historic first day cover and related stamps
APS Experts Certify Omitted Die Cut Error Panes on Bush Stamp
Adventures in Expertizing: APEX Certificate Leads to Celebration
How to enter the Virtual Stamp Show site
Meet James Peter Gough, 2020 Luff Award Winner for Distinguished Philatelic Research
Scott English, Executive Director
Gary Loew, Editor in Chief
Thomas Loebig, Director of Membership